News Articles

JEOL and SCiLS Sign a Distribution Agreement for SCiLS Lab MVS Software TOKYO -Thursday 10 June 2021  

(BUSINESS WIRE)-- JEOL Ltd.(TOKYO:6951) (President & COO Izumi Oi) and SCiLS, a division of Bruker Daltonics, announced that they have concluded a non-exclusive, worldwide distribution agreement for SCiLS Lab MVS software. https://www.jeol.co.jp/en/products/detail/MS-Imaging.html The SCiLS...

JEOL: Release of Electron Beam Metal AM Machine “JAM-5200EBM” -Saturday 27 March 2021  

(BUSINESS WIRE) -- JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of Electron Beam Metal AM Machine JAM-5200EBM from March 26, 2021. Using technology of the world's highest level performance electron microscope and electron beam lithography system for semiconductor...

JEOL: Release of the New Gas Chromatograph – Time-of-flight Mass Spectrometer JMS-T2000GC AccuTOF(TM) GC-Alpha... -Wednesday 17 February 2021  

(BUSINESS WIRE)-- JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of JMS-T2000GC "AccuTOF(TM) GC-Alpha", the latest model of the successful AccuTOF(TM) GC series gas chromatograph – time-of-flight mass spectrometers, to be released in February 2021. This product is a...

JEOL: Release of the New Scanning Electron Microscope JSM-IT700HR -Tuesday 4 August 2020  

(BUSINESS WIRE)-- JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in August 2020. Development background Scanning electron microscopes are used in various fields, such...

US Department of Homeland Security, Customs and Border Protection, Selects JEOL Mass Spectrometers for Five Labs -Wednesday 10 June 2020  

(BUSINESS WIRE)-- JEOL USA, INC., a wholly owned subsidiary of JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi), has been awarded a major contract by the US Department of Homeland Security Customs and Border Protection (DHS – CBP) for five JEOL AccuTOF™ LC-plus 4G Time-of-Flight Mass...

JEOL: Release of a New Schottky Field Emission Scanning Electron Microscope JSM-IT800 -Wednesday 27 May 2020  

(BUSINESS WIRE)-- JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-IT800 in May 2020. Development Background Scanning electron microscopes (SEMs) are used in various fields, such as nanotechnology,...

JEOL: Release of a New Ultrahigh Atomic Resolution Analytical Electron Microscope JEM-ARM300F2 (GRAND ARM(TM)2) -Saturday 15 February 2020  

(BUSINESS WIRE)-- JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new atomic resolution analytical electron microscope, JEM-ARM300F2 (GRAND ARM(TM)2) to be released in February 2020. Product development background In Electron Microscopy, a great number of...

JEOL: Release of a New Schottky Field Emission(FE) Scanning Electron Microscope JSM-F100 -Sunday 4 August 2019  

(BUSINESS WIRE) -- JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100 in August 2019. https://www.jeol.co.jp/en/news/detail/20190804.3456.html Background Scanning electron...

JEOL: Release of a New Benchtop Scanning Electron Microscope JCM-7000 Series NeoScopeTM -Monday 11 March 2019  

(BUSINESS WIRE) -- JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScopeTM, to be released in March 2019. Product development background Benchtop scanning electron...